Zeiss
Contura G 2 CMM alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
Signatone
1070
Test & Probe
Cascade Microtech
11000
Test & Probe
Signatone
1160
Test & Probe
The Signatone 1160 is a probe station microscope for viewing samples and parametric probing of devices.
Agilent
11729 C Carrier Noise Test Set
Test & Probe
The Agilent 11729C Carrier Noise Test Set is an integral part of a phase noise measurement system, capable of up-converting, down-converting, and phase/frequency demodulation.
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