Tool family
The Advantest T 5581 H is a test and probe system used for electrical evaluation of semiconductor devices at the wafer stage. Machines of this class combine wafer handling and probing with automated test functions to check device behavior before singulation and later packaging steps.
The Advantest T 5581 P Memory Test System is a memory test system with a tester mainframe that includes high-speed transfer buses, pattern generation, timing, compare, DC parametric test, and programmable power supplies.
General referenceThe Advantest T 5581 H is a test and probe system used for electrical evaluation of semiconductor devices at the wafer stage. Machines of this class combine wafer handling and probing with automated test functions to check device behavior before singulation and later packaging steps.
The Advantest T 5581 P Memory Test System is a memory test system with a tester mainframe that includes high-speed transfer buses, pattern generation, timing, compare, DC parametric test, and programmable power supplies.