Advantest

The Advantest T5593 is a memory ATE system designed for testing DDR2 SDRAM and other high-speed memory devices, capable of handling up to 256 devices.

The Advantest 93000 PS 800 LTH is a tester with 768 channels.

The Advantest V 93000 SOC Series is a system-on-chip (SOC) test system with a variety of testhead boards including PS800, Clock, MSDPS, Digital DC/DC, Analog DC/DC, and AV8.

The Advantest T5801 is a memory test system capable of testing ultra-high-speed DRAM devices.

The Advantest T2000 AiR2X is an air-cooled SoC and power analog test solution unveiled by Advantest.

The V93000 EXA Scale is an Advantest SoC test system described as a leading-edge semiconductor test solution for next-generation SoCs.

The Advantest T 6581 T Digital Meter is a digital meter manufactured by Advantest.

The Advantest M 6242 is a handler for BGA, CSP, and TSOP 1 target packages.

The Advantest T 5585 is a tester in the Test & Probe category.

The Advantest ND 4 CP is a tester.

The Advantest V 93000 PS 1600 CTH is a tester identified with a utility of 256, PS 1600 A (4), PS 9 G (2), a workstation Z 620, and a manipulator Eng Cart.

The Advantest Versatest V4000 is an automated test equipment system.

The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.

The Advantest V 93000 PS 800 STH is a tester.

The Advantest M6541AD is a test handler with a cold option that can be used in semiconductor testing.

The Advantest T5375 is an automated test equipment designed for memory testing, available with optional M6771AD handler.

The Advantest MPT 3000 ENV is a Gen 4 tester used for semiconductor testing.

The Advantest T 5371 is a tester for DRAM, SDRAM, CDRAM, SRAM, Flash memory, Direct RDRAM, EPROM, and masked ROM devices.

The Advantest T5375 is a memory test system designed for high-throughput testing of 300mm front-end DRAMs and high-speed back-end flash memories, introduced in June 2001.

The Advantest TR6846 is a 4.5-digit desktop digital multimeter designed for precise measurement of voltage, current, resistance, capacitance, frequency, and temperature.

The Advantest T5503A is an automated test system for semiconductor testing, featuring a maximum frequency of 1.143 GHz / 2.286 Gbps and up to 8,448 test head channels.

The Advantest T 5375 Memory is a memory test system.

The Advantest T 5335 is a semiconductor tester introduced in 2007.

The Advantest M 6751 A is a dynamic test handler.

The Advantest T 5377 S Wafer is a wafer tester in the Test & Probe category.

The Advantest Q8384 is a high-end optical spectrum analyzer with a monochromator system offering 10 pm resolution and wide dynamic range.

The Advantest T 5377 S is an automatic test equipment (ATE) system.

The Advantest B 6700 S is a semiconductor test and probe tool recorded in equipment inventory listings.

The Advantest T 6575 A is a tester manufactured by Advantest.

Advantest V 93000 K STH is a tester with PS1600A, DPS128HC, 128 Utility, Standard DUTScale, Z800 Workstation, and SmarTest and base license installed.

The Advantest M 6771 AD x 64 is a handler supporting 12-inch wafers.

The Advantest T 6577 is a VLSI test system manufactured by Advantest.

The Advantest V 93000 PS 400 is a semiconductor test system component for the V 93000 tester, featuring a Compact Test Head and PS 400 pin scale card/board configuration.

The Advantest M 6542 AD is a dynamic test handler used in semiconductor testing.

The Advantest V 93000 P 600 is a Test & Probe tool manufactured by Advantest and part of the Advantest V 93000 family.

General referenceThe Advantest T 5581 H is a test and probe system used for electrical evaluation of semiconductor devices at the wafer stage. Machines of this class combine wafer handling and probing with automated test functions to check device behavior before singulation and later packaging steps.

The Advantest V 93000 PS 400 SoC is a test and probe tool identified by model name in an equipment inventory and a research database.

The Advantest V 93000 C (2 CC) DUT Test Head is a device-under-test (DUT) test head designed for semiconductor testing.

The Advantest T 5588 is a memory test system designed for high-throughput mass-production testing of high-speed memory devices such as DDR2-SDRAMs.

The Advantest T 2000 EEP (SP 2) is a tester in the Test & Probe category.