Tool family
Bruker / Jordan Valley JVX 5200 T is a metal film thickness measurement system described as a fluorescent XRA frame from 2004.
The Bruker / Jordan Valley JVX 5200 T X-ray Reflectometer is a metrology and inspection tool with XRF and XRR measurement systems, a Brooks Series 8 25-slot 12-inch loadport, and a cryo tiger cooling system.
Bruker / Jordan Valley JVX 5200 T is a metal film thickness measurement system described as a fluorescent XRA frame from 2004.
The Bruker / Jordan Valley JVX 5200 T X-ray Reflectometer is a metrology and inspection tool with XRF and XRR measurement systems, a Brooks Series 8 25-slot 12-inch loadport, and a cryo tiger cooling system.