Waferpedia

Tool family

Filmetrics F80

Filmetricsthin-film thickness measurement system1 entry

Filmetrics F80 is a thin-film thickness mapping system for product wafers that measures patterned wafers and generates thickness images.

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Models in this family

  1. F80introduced 2001Legacy

    Filmetrics F80 is a thin-film thickness mapping system for product wafers that measures patterned wafers and generates thickness images.

    Cited variants

    DesignationGenerationVintageChangesSource
    F80-T———web.archive.org[1]
    F80-C———instrumenthive.com[2]

Sources

Sources (2)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]instrumenthive.cominstrumenthive.com