Filmetrics

The Filmetrics F50-UV is a thin-film metrology tool that measures film thickness via spectroscopic reflectometry and can generate thickness uniformity maps.

The Filmetrics R50 – 200 – 4PP is a metrology tool configured by default for metallic layers and sample thicknesses of 525 µm ± 25 µm.

The Filmetrics F-40-UV is a microscope-mounted optical reflectometer for rapid thin film thickness and optical constants measurements.

The Filmetrics 4PP is a sheet resistance measurement tool in the Characterization category.

The Filmetrics F50 is an optical film thickness and wafer-mapping system for thickness and optical property measurements on substrates.

The FilMetrics F20-UV is an optical measurement instrument listed in EPFL's Center of MicroNanoTechnology equipment pages.

The Filmetrics F80-C is a film thickness mapping tool for patterned wafers that uses Thickness Imaging technology to generate thickness images quickly.

The Filmetrics F10-HC is a hardcoat thickness measurement instrument based on the F20 platform that measures single- and multi-layer hardcoats using spectral reflectance analysis.

The Filmetrics R50-4PP is a four-probe measurement system for metal, conductive oxide, silicon, and polysilicon layers.

The Filmetrics RS50 is a 4-point probe mapping system for sheet resistance measurement.

The Filmetrics F40 is a film-thickness measurement instrument used for patterned films and reflectometry applications.

The Filmetrics F54-XY-200 is an automated thickness mapping system with measurement range from 4 nm up to 35 µm.

The Filmetrics F10-AR is an anti-reflection coating measurement system designed for ophthalmic anti-reflection coatings and hardcoats.

The Filmetrics F10-PA is a parylene thickness measurement system designed specifically for parylene thickness measurements.

The Filmetrics F37 is an in-line thickness measurement system for measuring film thickness in-line and in real time at up to seven locations.

The Filmetrics F42 is a thin-film thickness measurement system for mapping thickness at over one-million points with spot sizes as small as 3 microns.

The Filmetrics F60 is a film thickness and index mapping instrument for production environments.

The Filmetrics F60-t is a film thickness and index mapping instrument for production environments with automatic notch finding, on-board baselining, and an enclosed measurement stage with motion interlock.

The Filmetrics F70 measures the thickness of glass and plastic materials up to 13 mm thick.

Filmetrics F80 is a thin-film thickness mapping system for product wafers that measures patterned wafers and generates thickness images.

The Filmetrics F10-VC is a simultaneous reflectance and transmittance measurement instrument with optional thickness and index measurement modules.

The Filmetrics F80-A is a film thickness mapping tool for patterned wafers that combines full F80 functionality with Ricmar's WTT 300 Wafer Transfer Tool in a single EFEM platform.

The Filmetrics F20 is an optical reflectometer used to measure film thicknesses of dielectrics, semiconductors, and thin metals.

The Filmetrics F20-EXR uses spectral reflectance for measuring ITO thickness and other display-layer films.

Filmetrics F20s is a film-measurement instrument used in university teaching labs and for measuring thin-film thickness and optical properties in several application areas.

The Filmetrics F80-T is a film thickness mapping system for patterned wafers that uses Thickness Imaging technology.

Profilm3D is a Filmetrics optical profiler used for profilometry-based film thickness measurements and 3D surface profiling.

The Filmetrics F30 is a spectral reflectance system for real-time thin-film deposition monitoring.