Hitachi S 4700

Models in this family

1. 

   S 4700 FE-SEM

   Hitachi S 4700 FE-SEM is a field emission scanning electron microscope used for metrology and inspection. Machines of this class provide high-magnification surface imaging and measurement support for small-scale features.

2. 

   S 4700 I
3. 

   S 4700 II

   The Hitachi S 4700 II is a scanning electron microscope described as a single-phase system with a Windows 2000-based control system.

4. 

   S 4700 II FE-SEM
5. S 4700 l