Hitachi

The Hitachi S 9200 is a scanning electron microscope (SEM) used for critical dimension (CD) measurements and wafer inspection, designed for 8-inch wafer processing.

The Hitachi HV-270 is a rechargeable battery version of the Magic Wand vibrator, which is AC-powered and also known by other names.

The Hitachi S 4800 is a field emission scanning electron microscope with a cold field-emission source and 12-inch wafer capability.

The Hitachi Kokusai DD 812 V is a diffusion system designed for N2 anneal processing of 6-inch wafers.

The Hitachi S 9380 is a CD-SEM (Critical Dimension Scanning Electron Microscope).

The Hitachi 8640 is a CD-SEM (Critical Dimension Scanning Electron Microscope).

The Kokusai VR-120S is a 4-point resistivity system for measuring sheet resistance and resistivity of conductive samples on wafers from 2 to 12 inches.

The Hitachi NX 5000 is a Focused Ion Beam - Scanning Electron Microscope (FIB-SEM) tool manufactured by Hitachi.

The Hitachi S 88 xx Robot Controller is a robot controller for semiconductor manufacturing equipment.

The Hitachi S 9220 CD-SEM is a critical dimension scanning electron microscope used for semiconductor metrology.

The Hitachi S 7840 is a CD-SEM (Critical Dimension Scanning Electron Microscope) for 6-inch and 8-inch wafers.

The Hitachi NB 5000 Dual Beam FIB-SEM is a focused ion beam and scanning electron microscope system with listed SEM and FIB resolution specifications.

The Hitachi SU 8030 FEG-SEM is a field emission gun scanning electron microscope.

The Hitachi S 4700 II is a scanning electron microscope described as a single-phase system with a Windows 2000-based control system.

The Hitachi 9200 CD-SEM is a critical dimension scanning electron microscope.

The Hitachi S 4160 is a field emission scanning electron microscope (FE-SEM) introduced in 1996.

The Hitachi U 3900 is a double-beam, single-monochromator UV-visible spectrophotometer for research-grade analytical use.

The Hitachi IML 6 1 Ion Mill is an ion mill with a 6 inch wafer size.

The Hitachi S 4500 is a scanning electron microscope.

The Hitachi S 8820 S is a CD-SEM (Critical Dimension Scanning Electron Microscope) for 8-inch wafers.

The Hitachi PD 3000 is a mask visual inspection tool supporting 8-inch wafers, introduced in 1994.

The Hitachi Z-5310 is a polarized Zeeman atomic absorption spectrophotometer used for quantitative analysis of metallic elements.

The Hitachi Z-5010 is a polarized Zeeman atomic absorption spectrophotometer for elemental analysis using a flame method.

The Hitachi IS 2700 SE E-Beam is an electron-beam inspection tool categorized under Metrology & Inspection.

The Hitachi 9380 II CD-SEM is a critical dimension scanning electron microscope used for metrology and inspection in semiconductor manufacturing.

The Hitachi S 5000 FE-SEM is a field emission scanning electron microscope in the Metrology & Inspection category.

The Hitachi RS 6000 SEM Review is a scanning electron microscope for metrology and inspection of 12-inch wafers.

The Hitachi S 5000 is a field emission scanning electron microscope.

The Hitachi S 7800 is a Critical Dimension Scanning Electron Microscope (CD-SEM) designed for 8-inch wafers, offering a standard resolution of 5 nm at 1 kV.

The Hitachi S 2150 is a scanning electron microscope (SEM) used for metrology and inspection applications.

The Hitachi LS 9200 T is a surface particle measurement system supporting 12-inch wafers and operating at 100 V, 50/60 Hz, single phase, 5 kVA.

The Hitachi CG 6300 i is a scanning electron microscope (SEM) manufactured by Hitachi.

The Hitachi RS 5500 is a scanning electron microscope (SEM).

The Hitachi SU 1510 VP-SEM is a variable pressure scanning electron microscope manufactured in 2009.

The Hitachi 16036 N is a clean bench system.

The Hitachi 1305 BSG 3 is a clean bench designed for wet processing and cleaning in semiconductor manufacturing.

The Hitachi S 8820 is a scanning electron microscope in the Metrology & Inspection category.

The Hitachi M 9010 XST is a polysilicon etcher for 12-inch wafers.

The Hitachi S 9220 CD-SEM is a critical dimension scanning electron microscope used for length measurement of semiconductor features.