Hitachi

The Hitachi S-4700 is a field emission scanning electron microscope used for detailed image analysis and equipped with EDX capabilities.

The Hitachi S 9260 A is a CD-SEM used for critical dimension measurement in semiconductor manufacturing.

The Hitachi S 9200 is a scanning electron microscope (SEM) used for critical dimension (CD) measurements and wafer inspection, designed for 8-inch wafer processing.

The Hitachi S 4800 is a field emission scanning electron microscope with a cold field-emission source and 12-inch wafer capability.

The Hitachi Kokusai DD 812 V is a diffusion system designed for N2 anneal processing of 6-inch wafers.

The Hitachi SU 8030 FEG-SEM is a field emission gun scanning electron microscope.

The Hitachi S-3400 is a variable pressure scanning electron microscope used for imaging non-conductive samples and elemental analysis.

The Hitachi S 7800 is a Critical Dimension Scanning Electron Microscope (CD-SEM) designed for 8-inch wafers, offering a standard resolution of 5 nm at 1 kV.

The Hitachi HL 7000 M is an E-beam lithography system.

The Hitachi 16036 N is a clean bench system.

The Hitachi M 9010 XST is a polysilicon etcher for 12-inch wafers.

The Hitachi U 3900 H Spectrophotometer is a spectrophotometer that includes a CPU, monitor, connector, and lens holder, with a vintage of 2008.