Tool family
Hitachi S 9200
Models in this family
The Hitachi S 9200 is a scanning electron microscope (SEM) used for critical dimension (CD) measurements and wafer inspection, designed for 8-inch wafer processing.
The Hitachi S 9200 CD-SEM is a critical dimension scanning electron microscope.
All entries
- S 9200Hitachi
The Hitachi S 9200 is a scanning electron microscope (SEM) used for critical dimension (CD) measurements and wafer inspection, designed for 8-inch wafer processing.
CategoryMetrology & Inspection3 specs - S 9200 CD-SEMHitachi
The Hitachi S 9200 CD-SEM is a critical dimension scanning electron microscope.
CategoryMetrology & Inspection4 specs