Tool family
Hitachi S4600
The Hitachi S-4700 FE-SEM is a cold field emission high-resolution scanning electron microscope configured for secondary, backscattered electron, and characteristic X-ray detection.
Models in this family
The Hitachi S-4700 FE-SEM is a cold field emission high-resolution scanning electron microscope configured for secondary, backscattered electron, and characteristic X-ray detection.
