Waferpedia

Tool family

Woollam M-2000D

WoollamSpectroscopic ellipsometer1 entry

The J.A. Woollam M-2000D Spectroscopic Ellipsometer is a fully automated measurement tool for optical properties of thin film semiconductor materials.

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Models in this family

  1. M-2000D

    The J.A. Woollam M-2000D Spectroscopic Ellipsometer is a fully automated measurement tool for optical properties of thin film semiconductor materials.