13 entries
The Malvern Panalytical X'Pert Pro MRD XL is an X-ray diffractometer used for metrology in semiconductor and materials analysis.
The Malvern Panalytical X'Pert 3 MRD XL is an XRD (X-ray Diffractometer) with listed wafer holders for 6 inch and 300 mm wafers.
The Malvern NS300 NanoSight is a nanoparticle tracking analysis system for characterizing nanoparticles in liquid, including size distribution and concentration.