Applied Materials
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An epitaxial deposition system is semiconductor manufacturing equipment used to grow a controlled crystalline layer on a crystalline wafer surface. Epitaxial reactors are part of the deposition family of tools. Epitaxial growth is used when the deposited silicon layer must preserve crystal alignment with the underlying substrate.
Epitaxial deposition systems process wafers in a chamber where silicon-bearing process gases react at the wafer surface and form a single-crystal film. Epitaxial growth differs from non-epitaxial deposition because the deposited layer follows the crystal structure of the substrate. Epitaxial process control commonly focuses on film thickness, dopant incorporation, defectivity, and interface quality.
Epitaxial silicon deposition is used in front-end wafer processing when a device flow requires a grown silicon layer with controlled structure and composition. Epitaxial steps are typically placed after wafer preparation and surface cleaning because surface condition strongly affects crystal growth. Epitaxial growth is typically followed by additional front-end operations such as thermal processing, implantation, lithography, etch, and dielectric formation.
Epitaxial silicon deposition is used to form engineered silicon layers for device structures that need controlled electrical properties and a defined crystalline relationship to the substrate. Epitaxial layers can serve as device layers, collector or drift regions, buried-layer overgrowth structures, or starting surfaces for later front-end patterning. Epitaxial silicon processes are used in logic, memory, analog, and power related fabrication flows when the device design calls for a grown crystalline silicon film.
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The following facts about the Centura 300 EPI are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Centura 300 EPI are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Centura 300 EPI are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Centura 300 EPI are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Centura 300 EPI are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Centura 300 EPI is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 16, 2026.
The Applied Materials 0010-13622 is an RF match unit intended for PVD (Physical Vapor Deposition) described as a High Efficiency HE RF Match-Bias.
The Applied Materials 0020 12458 Part is an insulator, side match component for the Hdp-Cvd Ultima Plus system.