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93000 alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Teradyne
ETS 364
Test & Probe
Teradyne ETS 364 is a test and probe system used to electrically evaluate semiconductor devices. Machines of this class combine probe contact, signal handling, and automated test control for device characterization and screening.
Teradyne
iFlex
Test & Probe
Teradyne
J 750
Test & Probe
Teradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
Teradyne
Ultra Flex SC
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
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