ETS 364

A tester in semiconductor manufacturing is electronic test equipment used to stimulate a device, measure its responses, and determine whether the device meets its intended electrical behavior. Test systems of this class are commonly configured with instrument resources, pin electronics, timing resources, control software, and an interface to the device under test.

Semiconductor test systems operate by applying programmed signals to device terminals and comparing measured outputs against expected results. Test systems of this class generally combine digital resources, analog resources, timing measurement capability, current or voltage measurement functions, and software control so that different test routines can be executed on the same platform.

Semiconductor electrical test sits after wafer fabrication has created the device structures and after packaging when the device is tested in final form, depending on the manufacturing flow and the test cell arrangement. Test equipment of this class is used where electrical functionality, timing behavior, and parametric performance need to be verified before devices move to later assembly, qualification, or shipment stages.

Semiconductor testers are used to execute production test, characterization, screening, and debug tasks on integrated circuits and related electronic devices. Test platforms of this class can support digital and analog measurements, timing checks, and current or voltage evaluation across device pins through a programmed test sequence.