Teradyne
iFlex
What it is
General reference — not yet source-verifiedTest systems in this class apply electrical stimuli to semiconductor devices and measure the resulting responses against programmed limits. Test and probe equipment in this class is used to verify device functionality and parametric behavior before later assembly or shipment decisions.
How it works
General reference — not yet source-verifiedAutomated test equipment in this class typically combines pattern generation, precision sourcing, measurement channels, switching, and timing resources under software control. Probe-capable test cells in this class commonly interface to a wafer prober so that electrical contact can be made to die pads across a wafer map before singulation.
Where it fits in the process flow
General reference — not yet source-verifiedTest and probe systems of this class are used after wafer fabrication when devices are ready for electrical verification. Test and probe systems of this class commonly operate at wafer sort with a prober, and related testers in the same class are also used again later in packaged-device test flows.
Applications
General reference — not yet source-verifiedAutomated semiconductor testers in this class are used for functional test, DC parametric test, AC characterization, continuity checks, and binning decisions. Probe-integrated use of this class supports screening of die on the wafer so that downstream assembly can be directed toward electrically acceptable devices.
What do the numbers mean?
Power & electrical2
Configuration & options29
- Slots Boards[1]
- 13 805-004-50 805-251-50[1]
- 12 805-002-60 U[1]
- 11 805-229-61 U[1]
- 10 805-386-01 U[1]
- 9 805-251-50 805-251-50[1]
- 8 805-333-50 805-251-50[1]
- 7 805-003-50 805-003-11[1]
- 6 U 805-251-50[1]
- 5 805-251-50 805-251-50[1]
- 4 805-386-01 U[1]
- 3 U U[1]
- 2 805-002-60 U[1]
- 1 805-004-50 805-251-50[1]
- 16xHSD200[10]
- 2xDC30[10]
- 2xDC75[10]
- 2xBBAC[10]
- 2xVHFAC[10]
- 16xHSD200 - 2xDC30 - 2xDC75 - 2xBBAC - 2xVHFAC[10]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000— Same function class: Test & Probe, UnknownCompare in depthsource[11]
- Advantest V 93000— Same function class: Test & Probe, UnknownCompare in depthsource[12]
- Advantest V 93000 DPS— Same function class: Test & Probe, UnknownCompare in depthsource[13]
- Advantest T 5377 S— Same function class: Test & Probe, nullCompare in depthsource[14]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the iFlex are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the iFlex are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the iFlex are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the iFlex are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the iFlex are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the iFlex is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (21)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]Inventory photo
- [7]Inventory photo
- [8]Inventory photo
- [9]Inventory photo
- [10]inventory listing
- [11]Equipment inventory listing
- [12]Equipment inventory listing
- [13]Equipment inventory listing
- [14]web.archive.orgweb.archive.org
- [15]Equipment inventory listing
- [16]Equipment inventory listing
- [17]Equipment inventory listing
- [18]Equipment inventory listing
- [19]Equipment inventory listing
- [20]Equipment inventory listing
- [21]Equipment inventory listing
Last updated Oct 16, 2026.
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