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HP / Verigy PS 3600 Pinscale alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
LTX-Credence
ASL 1000
Test & Probe
The LTX-Credence ASL 1000 is a test and probe machine used to electrically evaluate semiconductor devices and circuit structures before final assembly or further processing. Machines of this class combine probing and automated test functions to identify devices that meet electrical criteria and to screen out defective parts.
LTX-Credence
ASL 3000
Test & Probe
Teradyne
J 750
Test & Probe
Teradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
Teradyne
Ultra Flex SC
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
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