LTX-Credence
ASL 3000
The LTX / Credence ASL 3000 is a semiconductor tester. The LTX / Credence ASL 3000's computer configuration includes a Pentium 4 processor, 1GB RAM, 80GB HDD, and Windows NT 4.0 operating system.[1]
What it is
General reference — not yet source-verifiedAutomated test equipment applies electrical stimuli to semiconductor devices and measures the responses against programmed limits. Test and probe systems are used to verify device functionality and parametric behavior before later assembly or shipment decisions.
How it works
General reference — not yet source-verifiedTest and probe systems generally route stimulus and measurement resources through interface hardware to the device under test. Such systems commonly combine digital pattern execution, parametric forcing and sensing, timing measurement, switching, and control software so a programmed test sequence can characterize each device site.
Where it fits in the process flow
General reference — not yet source-verifiedTest and probe equipment is used after wafer fabrication has produced electrically complete devices and before later packaging flow is fully concluded. Probe configurations contact devices on wafers, while final-test style configurations evaluate packaged parts after assembly and before binning or release.
Applications
General reference — not yet source-verifiedTest and probe systems are used for electrical verification, parametric measurement, functional screening, timing-related checks, and sorting decisions on semiconductor devices. Such equipment is applied where a product requires repeatable stimulus, measurement, and pass-fail evaluation across many devices.
What do the numbers mean?
Power & electrical4
- Board slots
- Slot 1: Octal VI Card; Slot 2: Pulsed V/I V3; Slot 3: Octal VI Card; Slot 4: Pulsed V/I V3; Slot 6: Time Measurement Unit; Slot 8: Dual OP-AMP Loop Card; Slot 10: 4 Quadrant V/I; Slot 14: Relay MUX Card; Slot 15: Octal VI Card; Slot 16: Octal VI Card; Slot 17: Octal VI Card; Slot 20: Relay MUX Card; Slot 24: 4 Quadrant V/I; Slot 26: 4 Quadrant V/I; Slot 27: Assy 678-4548-03, Rev A; empty slots 7, 9, 11, 12, 13, 18, 19, 21, 22, 23, 25[4]
Control & software6
Configuration & options55
- Tester boards:[1]
- OVI (4)[1]
- TMU[1]
- DVI2k (4)[1]
- MUX LV[1]
- MDI (4)[1]
- CLK4[1]
- Pentium 4 processor[1]
- 1GB ram[1]
- 80 GB HDD[1]
- Windows NT 4.0[1]
- OVI (Octal VI Card) 671 3032 (4)[2]
- TMU (Time Measurement) 671 5333[2]
- DVI 300 671 4678[2]
- DVI 2000 671 4676 (2)[2]
- MUX (Relay Mux Card) 671 5351[2]
- MDI 671 4534[2]
- CLK 4 672 6135[2]
- BTB 4 (Baseband transition board) 671 5366[2]
- Brick (16 Ports) 650 4717[2]
- For Parts[5]
- Board Complement (Part Numbers)
- OVI (Octal VI Card) 671 3032 (4), TMU (Time Measurement) 671 5333, DVI 300 671 4678, DVI 2000 671 4676 (2), MUX (Relay Mux Card) 671 5351, MDI 671 4534, CLK 4 672 6135, BTB 4 (Baseband transition board) 671 5366, Brick (16 Ports) 650 4717[2]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest HP / Verigy PS 3600 Pinscale— Same function class: Test & Probe, UnknownCompare in depthsource[6]
- Teradyne Nextest Magnum I PV— Same function class: Test & Probe, UnknownCompare in depthsource[7]
- Teradyne ETS 200 T— Same function class: Test & Probe, UnknownCompare in depthsource[8]
- Teradyne MicroFlex— Same function class: Test & Probe, UnknownCompare in depthsource[9]
- Teradyne J 750 S— Same function class: Test & Probe, UnknownCompare in depthsource[10]
- Teradyne J 750 EX— Same function class: Test & Probe, UnknownCompare in depthsource[11]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Slot 8Dual OP-AMP Loop Card: Assy 960006-04[4]
- Electrical requirements208-240 VAC, 50 A, 50/60 Hz[4]
- Power208-240 VAC, 50 A, 50/60 Hz[4]
- Board slotsSlot 1: Octal VI Card; Slot 2: Pulsed V/I V3; Slot 3: Octal VI Card; Slot 4: Pulsed V/I V3; Slot 6: Time Measurement Unit; Slot 8: Dual OP-AMP Loop Card; Slot 10: 4 Quadrant V/I; Slot 14: Relay MUX Card; Slot 15: Octal VI Card; Slot 16: Octal VI Card; Slot 17: Octal VI Card; Slot 20: Relay MUX Card; Slot 24: 4 Quadrant V/I; Slot 26: 4 Quadrant V/I; Slot 27: Assy 678-4548-03, Rev A; empty slots 7, 9, 11, 12, 13, 18, 19, 21, 22, 23, 25[4]
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- LTX / Credence ASL 3000 Power SupplyIn Productionsource[12]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
How are test programs created for these machines?General reference — not yet source-verified
Test programs are developed using the system's proprietary software environment, typically through graphical flow-chart editors or text-based languages like STIL (Standard Test Interface Language). Engineers define test sequences, stimulus parameters, and pass/fail limits for each device type.
What does the test system interface look like?General reference — not yet source-verified
The system connects to the device through a test interface board that carries either a probe card for wafer-level testing or a socket for final packaged testing. The interface provides reliable electrical contact and signal routing between the test head and the device.
What is the typical maintenance requirement for such test systems?General reference — not yet source-verified
Routine maintenance includes periodic calibration of internal instruments, cleaning of contact probes or sockets, and software updates. Preventive maintenance schedules are recommended to ensure measurement accuracy and uptime.
Not publicly documented
The following facts about the ASL 3000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ASL 3000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ASL 3000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ASL 3000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ASL 3000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the ASL 3000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (12)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]inventory listing
- [6]Equipment inventory listing
- [7]Equipment inventory listing
- [8]Equipment inventory listing
- [9]Equipment inventory listing
- [10]Equipment inventory listing
- [11]Equipment inventory listing
- [12]Equipment inventory listing
Last updated Oct 17, 2026.
Compare with similar tools
View all →The Teradyne / Eagle ETS 200 T is a tester that is used with an Electroglas EG 4090 prober for 8-inch wafers.
The Advantest HP / Verigy PS 3600 Pinscale is a Test & Probe tool in the Advantest HP / Verigy family.
The Teradyne J 750 EX is a tester manufactured by Teradyne.
The Teradyne J 750 S is a tester that requires 3-phase power at 208 Vac, 30 A, 50/60 Hz.
