Keysight
Medalist i 3070 ICT alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Teradyne
TS 121 ICT
Test & Probe
The Teradyne TS 121 ICT is an in-circuit tester configured with Windows XP and Teradyne Navigate 6.4.0.0.28 software.
Tenney
, TPS JR-A-F4T Junior compact temperature test chambers
Test & Probe
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
Rorze
03 RR 8120-001-001 Wafer Exchanger
Test & Probe
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
Applied Materials
0720 06060 Part
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
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