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ASL 1000 alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
HP / Verigy PS 1600 Smartscale
Test & Probe
The PS 1600 Smartscale is a semiconductor test system from Advantest/Agilent/HP/Verigy, introduced in 2012 and including components such as PS 1600 modules, DPS 32, and a Compact Test Head.
Advantest
HP / Verigy PS 3600 Pinscale
Test & Probe
Teradyne
J 750 EX
Test & Probe
Teradyne J 750 EX is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates devices and identifies dies or parts that meet specification.
Teradyne
J 750 S
Test & Probe
Teradyne J 750 S is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates integrated circuits while they are still on wafer or in related test handling workflows.
Teradyne
MicroFlex
Test & Probe
Teradyne MicroFlex is a test and probe system used for electrical examination of semiconductor devices and wafers. It belongs to the class of equipment that makes controlled contact with device pads or probe sites so signals and measurements can be applied and read back.
Teradyne
Nextest Magnum I PV
Test & Probe
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