Teradyne
J 750 S
What it is
How it works
General reference — not yet source-verifiedA semiconductor tester applies electrical stimuli to a device under test and measures the resulting responses to determine whether the device meets expected behavior. In a probe environment, the tester works with probe access to contact unpackaged die before later assembly steps.
Where it fits in the process flow
General reference — not yet source-verifiedThis class of equipment fits in the testing portion of semiconductor manufacturing, including probe-stage inspection before packaging and final device test after assembly.
It is used to screen devices during production so that parts failing electrical checks can be separated from conforming parts before they move to later process steps.
What do the numbers mean?
Power & electrical3
- 50/60 Hz[1]
Configuration & options2
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 1000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the J 750 S are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 S are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the J 750 S are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the J 750 S are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J 750 S are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 S is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Equipment inventory listing
- [5]Equipment inventory listing
- [6]Equipment inventory listing
Last updated Jul 30, 2026.
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General referenceThe Advantest 93000 Smart Scale is a test and probe system used in semiconductor device evaluation and sorting. Machines of this class are used to contact device sites, apply test conditions, and record electrical responses for production screening and characterization.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
General referenceThe LTX-Credence ASL 1000 is a test and probe machine used to electrically evaluate semiconductor devices and circuit structures before final assembly or further processing. Machines of this class combine probing and automated test functions to identify devices that meet electrical criteria and to screen out defective parts.
