Teradyne
MicroFlex
What it is
General reference — not yet source-verifiedIn this equipment class, a tester applies controlled signals, captures responses, and compares measured behavior with expected results to sort, qualify, or debug semiconductor parts. It sits in the broader family of automated test equipment used in semiconductor manufacturing and test operations.
Where it fits in the process flow
The Teradyne MicroFlex is a test system rather than a wafer-processing tool, so its role is verification and characterization of electrical function. The patent material tied to semiconductor testing systems shows that such equipment is used for testing digital circuits and programmable logic devices, including FPGA-related test and programming operations.[6]
Applications
General reference — not yet source-verifiedThe listed module mix suggests use where both high-speed signal handling and direct-current measurement are needed in the same test program. That combination is typical of device test workflows that combine functional verification with power, continuity, and parametric checks.
What do the numbers mean?
Control & software1
Configuration & options10
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[4]
- LTX-Credence ASL 1000— Same function class: Test & Probe, UnknownCompare in depthsource[4]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[4]
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[4]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the MicroFlex are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MicroFlex are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MicroFlex are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MicroFlex are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MicroFlex are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MicroFlex is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (9)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]inventory listing
- [5]inventory listing
- [6]US11747400B2 - Method of converting a serial vector format (SVF) file to a vector compatible with a semiconductor testing system - Google Patents — patents.google.compatents.google.com
- [7]Equipment inventory listing
- [8]US20140292361A1 - Testing Integrated Circuit Packaging for Output Short Circuit Current - Google Patents — patents.google.compatents.google.com
- [9]CN108226746B - Test Method of Transconductance Operational Amplifier MAX436 Based on Micro FLEX - Google Patents — patents.google.compatents.google.com
Last updated Jul 29, 2026.
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General referenceThe Advantest 93000 Smart Scale is a test and probe system used in semiconductor device evaluation and sorting. Machines of this class are used to contact device sites, apply test conditions, and record electrical responses for production screening and characterization.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
General referenceThe LTX-Credence ASL 1000 is a test and probe machine used to electrically evaluate semiconductor devices and circuit structures before final assembly or further processing. Machines of this class combine probing and automated test functions to identify devices that meet electrical criteria and to screen out defective parts.
