Teradyne
J 750 EX
What it is
How it works
Production board test systems are used with software and automation intended to maintain fault coverage while preserving throughput in manufacturing test flow.[7]
Where it fits in the process flow
General reference — not yet source-verifiedWithin this class, the system is used for in-circuit and production board test coverage on assembled circuit boards and related electronics, supporting detection of shorts, opens, and other assembly faults.
Applications
The Teradyne production board test application covers automotive electronics such as in-vehicle infotainment, body electronics, driving assistance systems, and dashboard electronics.[7]
The same production board test family is used for in-circuit testing and boundary-scan-oriented test workflows on assembled boards.[7]
What do the numbers mean?
Configuration & options6
Vintage & configurations
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 1000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What type of test system is the J 750 EX?
It is a production board test system used in electronics manufacturing test.[7]
Does the named production board test family include in-circuit test?
Yes. The family includes in-circuit testing.[7]
Does the named production board test family include boundary scan?
Yes. The family includes boundary scan test options.[7]
Not publicly documented
The following facts about the J 750 EX are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 EX are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the J 750 EX are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J 750 EX are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 EX is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the J 750 EX are on record.
Answerable by: university cleanroom staff or an OEM application specialist
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (10)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]inventory listing
- [7]web.archive.org — teradyne.com (May 5, 2026)web.archive.org
- [8]Equipment inventory listing
- [9]Equipment inventory listing
- [10]Equipment inventory listing
Last updated Jul 30, 2026.
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General referenceThe Advantest 93000 Smart Scale is a test and probe system used in semiconductor device evaluation and sorting. Machines of this class are used to contact device sites, apply test conditions, and record electrical responses for production screening and characterization.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
General referenceThe LTX-Credence ASL 1000 is a test and probe machine used to electrically evaluate semiconductor devices and circuit structures before final assembly or further processing. Machines of this class combine probing and automated test functions to identify devices that meet electrical criteria and to screen out defective parts.
