Teradyne
ETS 200 T alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
LTX-Credence
ASL 3000
Test & Probe
The LTX / Credence ASL 3000 is a semiconductor tester with a computer configuration including a Pentium 4 processor, 1GB RAM, 80GB HDD, and Windows NT 4.0 operating system.
LTX-Credence
Fusion HFT
Test & Probe
The LTX-Credence Fusion HFT is a configurable semiconductor tester used for device testing in production and NPI development.
Accretech
UF 3000 Automatic Wafer
Test & Probe
The Accretech / TSK UF 3000 is an automatic wafer prober.
Advantest
V 93000 PS 1600
Test & Probe
The Advantest V 93000 PS 1600 is a tester with an ATH (Advanced Test Head) configuration.
Tenney
, TPS JR-A-F4T Junior compact temperature test chambers
Test & Probe
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
Rorze
03 RR 8120-001-001 Wafer Exchanger
Test & Probe
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
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