Accretech
UF 3000 Automatic Wafer
Plate 01TSK UF3000 PROBER WAFER DUMMY TEST
ASE SEMICONDUCTORWatch on YouTubePlate 02ACCRETECH UF3000 WAFER DUMMY TEST VIDEO(F240124FB)
ASE SEMICONDUCTORWatch on YouTubePlate 03UF3000 ACCRETECH/TSK Wafer Prober System
Gustavo OrtegaWatch on YouTubePlate 04UF3000 TSK/ACCRETECH Wafer Prober System
Gustavo OrtegaWatch on YouTube
What is it?
Why won't it start?
Documented failure modes, common issues, and field considerations.
- Heating & cooling needs service
What do the numbers mean?
Power & electrical2
- Single Phase[1]
Wafer handling6
Configuration & options21
- Manipulator[11]
- Needle Cleaner (ceramic pad not included)[11]
- FDD[11]
- USB[11]
- 2 Wire + Ground[1]
- Stock Backing Plate (Has Aehr system backing Plate)[1]
- Heating & Cooling needs service[1]
- Without Probe card cleaning platen[1]
- Low Temperature[2]
- 280 x 160 Partially Cut[2]
- Tri-Temp[15]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Tokyo Electron Precio XL— Same function class: Test & Probe, UnknownCompare in depthsource[16]
- Semics Opus 3— Same function class: Test & Probe, UnknownCompare in depthsource[17]
- Electroglas EG 4090 u+— Same function class: Test & Probe, UnknownCompare in depthsource[18]
- Teradyne ETS 200 T— Same function class: Test & Probe, UnknownCompare in depthsource[19]
- Tokyo Electron Precio Automatic Wafer— Same function class: Test & Probe, UnknownCompare in depthsource[20]
- Tokyo Electron Precio Octo— Same function class: Test & Probe, UnknownCompare in depthsource[21]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the UF 3000 Automatic Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UF 3000 Automatic Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the UF 3000 Automatic Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UF 3000 Automatic Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the UF 3000 Automatic Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the UF 3000 Automatic Wafer are on record.
Answerable by: an OEM parts catalog or a service engineer
Sources & citations
Sources (25)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]Inventory photo
- [7]Inventory photo
- [8]Inventory photo
- [9]Inventory photo
- [10]Inventory photo
- [11]inventory listing
- [12]inventory listing
- [13]inventory listing
- [14]inventory listing
- [15]inventory listing
- [16]Equipment inventory listing
- [17]Equipment inventory listing
- [18]Equipment inventory listing
- [19]Equipment inventory listing
- [20]Equipment inventory listing
- [21]Equipment inventory listing
- [22]Equipment inventory listing
- [23]Equipment inventory listing
- [24]Equipment inventory listing
- [25]Equipment inventory listing
Last updated Jul 29, 2026.
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General referenceElectroglas EG 4090 u+ is a test and probe system used to electrically characterize semiconductor devices at the wafer level. Machines of this class combine precision wafer positioning with electrical measurement so individual dies or structures can be contacted and evaluated before singulation and later assembly.
General referenceSemics Opus 3 is a test and probe system used to evaluate semiconductor devices and wafers at the electrical test stage. It belongs to the class of equipment that brings measurement hardware into contact with device pads or probe sites so electrical characteristics can be assessed before later assembly or final release.
The Tokyo Electron Precio Automatic Wafer Prober is a 12-inch automatic wafer prober.
