Teradyne
TS 121 ICT alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Keysight
3070 S 2
Test & Probe
The Keysight 3070 S 2 is a Test & Probe tool in the Keysight 3070 family.
Keysight
3070 Series 3 ICT
Test & Probe
The Keysight / Agilent 3070 Series 3 is an in-circuit tester (ICT) for printed circuit board assembly testing, requiring 6-7 bar air pressure and consuming 100-170 l/min.
Keysight
Medalist i 3070 ICT
Test & Probe
The Keysight Medalist i 3070 ICT is an in-circuit tester in the Test & Probe category.
Tenney
, TPS JR-A-F4T Junior compact temperature test chambers
Test & Probe
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
Rorze
03 RR 8120-001-001 Wafer Exchanger
Test & Probe
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
Applied Materials
0720 06060 Part
Test & Probe
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