Waferpedia

Tool family

Applied Materials Complus

Applied MaterialsMetrology & Inspection2 entries
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Models in this family

  1. Complus 4 T

    Applied Materials Complus 4 T is an inspection system stated with 8-inch wafer size support.

  2. Complus 4 T Darkfield Defect

    Applied Materials Complus 4 T Darkfield Defect Inspection System is a darkfield defect inspection system with a 12-inch wafer size.

All entries

  1. Complus 4 TApplied Materials

    Applied Materials Complus 4 T is an inspection system stated with 8-inch wafer size support.

    CategoryMetrology & Inspection
    11 specs
  2. Complus 4 T Darkfield DefectApplied Materials

    Applied Materials Complus 4 T Darkfield Defect Inspection System is a darkfield defect inspection system with a 12-inch wafer size.

    CategoryMetrology & Inspection
    1 spec