Tool family
Cascade Microtech’s 300 mm probing solutions are described as flexible on-wafer probe systems for advanced, complex testing requirements.
Cited variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| CM300 | — | — | Described as a flexible on-wafer probe system that scales to meet evolving needs. | web.archive.org[1] |
| Elite 300 | — | — | Described as a probe station for RF/DC device characterization, wafer-level reliability, IC failure analysis, and design debug. | web.archive.org[1] |
| PM300 | — | — | Described as a manual probe station for semiconductor failure analysis and in-process testing. | web.archive.org[1] |
| PA300 | — | — | Described as a semi-automatic probe system configured with a vast array of accessories for wafer-level test. | web.archive.org[1] |