Cascade Microtech

The Cascade Microtech 103-754 is an x-y-z-θ probe positioner used in the HFTL 50-GHz Small-Signal Probe Station.

The Cascade Microtech Summit 11000 is a manual wafer prober for 200mm wafers used in DC and RF device characterization.

The Cascade Microtech R 6100 is a probe system described as an 8-inch prober with a thermal chuck, X/Y/Z/θ servos, and a vibration-damping table with a dark hood.

The Cascade Microtech SQ S 300 M 163 DHT 01 is a prober for 8-inch wafers.

The Cascade TEK TFO-10 is a large-capacity forced air-drying oven designed to meet both manufacturing and laboratory requirements.

The Cascade MicroTech EPS150 Triax is a probe station configured with a Keithley 2450 SMU and an Agilent LCR meter for electrical measurements.

The Cascade Microtech Summit 12862 is a prober used in semiconductor testing.

The Cascade MicroTech EPS150TRIAX Probe Station is a probe station with a light shield enclosure for probing small features and measuring electrical properties.

The Cascade Microtech Summit 12000 B-S is a probe station.

Cascade Microtech Elite 300 Wafer Prober is a 12-inch automated wafer prober with a precision low-noise femtoguard temperature chuck.

The Cascade 4-probes is a 4-probe station with an integrated LCR meter.

General referenceCascade Microtech 12000 is a test and probe system used for electrical probing and measurement of devices at wafer level. Machines of this class provide controlled contact between probe needles and device pads so signals can be applied and measurements collected before assembly.