Tool family
Hitachi NB 5000 Dual Beam FIB-SEM
Models in this family
The Hitachi NB 5000 Dual Beam FIB-SEM is a focused ion beam and scanning electron microscope system with listed SEM and FIB resolution specifications.
Tool family
The Hitachi NB 5000 Dual Beam FIB-SEM is a focused ion beam and scanning electron microscope system with listed SEM and FIB resolution specifications.
