Hitachi
NB 5000 Dual Beam FIB-SEM
Plate 01Three-dimensional reconstructed image of rat cerebellar cortex acquired with HITACHI NB5000 FIB-SEM.
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What is it?
What do the numbers mean?
Power & electrical3
Vacuum & pumping1
- (3) Vacuum System[1]
Optics & imaging5
Configuration & options11
- Premium System[1]
- 200 / 208 / 230 Vac[1]
- Vacc- 0.5Kv - 30Kv[1]
- ZrO/W Schottky - Emission Electron Gun[1]
- Max Beam Current - >30nA[1]
- HV Tank(SE)[1]
- Electro Static Blanking System[1]
- Signal mixing for SE/BSE/ExB with user controlled electron energy detection biasing[1]
- 2560 X 1920 Image Memory[1]
- Dual Monitor Simultaneous Display[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the NB 5000 Dual Beam FIB-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NB 5000 Dual Beam FIB-SEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NB 5000 Dual Beam FIB-SEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NB 5000 Dual Beam FIB-SEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NB 5000 Dual Beam FIB-SEM are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NB 5000 Dual Beam FIB-SEM is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (1)Every fact above is drawn from these public sources
- [1]Inventory photo
Last updated Jul 29, 2026.
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