Waferpedia

Tool family

Hitachi S-3400

The Hitachi S-3400 is a variable pressure scanning electron microscope used for imaging non-conductive samples and elemental analysis.

Models in this family

  1. The Hitachi S-3400 is a variable pressure scanning electron microscope used for imaging non-conductive samples and elemental analysis.

    Cited variants

    DesignationGenerationVintageChangesSource
    S-3400Nnanocenter.umd.edu[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]nanocenter.umd.edunanocenter.umd.edu