Waferpedia

Tool family

JEOL JEM-ARM300F

JEOL’s JEM-ARM300F is an atomic transmission electron microscope noted for a 300 kV microscope that first demonstrated 45 pm STEM resolution in 2014.

Models in this family

  1. JEOL’s JEM-ARM300F is an atomic transmission electron microscope noted for a 300 kV microscope that first demonstrated 45 pm STEM resolution in 2014.