JEOL

The JEOL AccuTOF JMS T100LC is a mass spectrometer that won a bronze award at the 2002 Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy.

The JEOL JSM-7500F is a scanning electron microscope with ultrahigh-resolution imaging and multiple detectors and imaging modes.

The JEOL JBX-8100FS is a spot-beam electron beam lithography system designed for high-throughput direct-write patterning on wafers up to 200mm.

JEOL's JEM-1 was the company's first commercial model transmission electron microscope.

JEOL's JNM-1 was the first NMR system in Japan, released in 1956.

DA-1 was a prototype magnetic field–type electron microscope developed by a group that included Kazuo Ito and sold to Mitsubishi in 1947.

The JEOL JLC-5AH is an amino acid analyzer, first produced in 1968 as the world's first such instrument.

The JEOL JEM 1011 is a transmission electron microscope manufactured by JEOL.

The JEOL JEM-7 is an electron microscope introduced in 1964 and described as the first electron microscope to include a mechanism for electrical adjustment of the lens axis.

JEOL’s JEM-ARM300F is an atomic transmission electron microscope noted for a 300 kV microscope that first demonstrated 45 pm STEM resolution in 2014.

The JEOL ML2 is a maskless lithography system. The JEOL ML2 uses a patented ZrO/W (Schottky) emitter.

The JEM-100B is a JEOL electron microscope model that incorporated an electromagnetic deflection unit and an electromagnetic stigmator.

General referenceThe JEOL JLC-500 is a metrology and inspection tool. In semiconductor and related microfabrication work, machines of this class are used to examine patterned surfaces and measure critical features for process control and defect review.