JEOL
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The JEOL JEM-ARM300F is an atomic transmission electron microscope. In 2014, a 300 kV microscope with the JEM-ARM300F first demonstrated a STEM resolution of 45 pm.[1]
The JEM-ARM300F is an electron microscopy instrument used for atomic transmission electron microscopy and STEM resolution demonstration.[1]
A STEM resolution of 45 pm with a 300 kV microscope was first demonstrated with the JEM-ARM300F.
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The following facts about the JEM-ARM300F are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented variants, configuration options, or revision breakpoints of the JEM-ARM300F are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the JEM-ARM300F are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the JEM-ARM300F are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the JEM-ARM300F is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the JEM-ARM300F are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Jul 29, 2026.
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