Onto Innovation MetaPulse 200

Models in this family

1. 

   MetaPulse 200 C Film Thickness Measurement

   The Onto Innovation / Rudolph MetaPulse 200 C is a film thickness measurement system for 8-inch wafers.

2. 

   MetaPulse 200 Film Metrology

   The Onto / Rudolph MetaPulse 200 is a film metrology tool for 8-inch wafers.

3. 

   MetaPulse 200 Film Thickness Measurement

   The Onto / Rudolph MetaPulse 200 is a film thickness measurement system for 8-inch wafers.

4. 

   MetaPulse 200 Metal Film Measurement
5. 

   MetaPulse 200 X Cu Film Metrology
6. 

   MetaPulse 200 XCu Metal Film Measurement

   The Onto Innovation MetaPulse 200 XCu Metal Film Measurement System is a contactless metal thickness measurement tool with wafer mapping, micro spot optics, multi-layer film capacity, and a PC controller.