Waferpedia

Tool family

Signatone H-100

The Signatone H-100 is a probe station with a three inch square device/substrate chuck, designed primarily for probing thick film devices.

Models in this family

  1. The Signatone H-100 is a probe station with a three inch square device/substrate chuck, designed primarily for probing thick film devices.

    Cited variants

    DesignationGenerationVintageChangesSource
    H-100web.archive.org[1]
    H-120web.archive.org[1]
    H-150can be equipped with a four inch diameter wafer chuck for probing wafers up to four inches in diameterweb.archive.org[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org