20 entries
- 58212 CLED MappingChroma
The Chroma 58212 CLED Mapping Prober is a mapping prober.
CategoryTest & Probe - 58173 LED Chip LevelChroma
The Chroma 58173 LED Chip Level Tester is a 6-inch test system used for LED chip-level testing.
CategoryTest & Probe - 3380 PChroma
- IX 210 ChromaDice Laser DicingChromaCategoryDicing & Grinding
- 80611Chroma
The Chroma 80611 Timing/Noise Analyzer is a module for the C8000 Automated Test System that provides highly accurate timing and noise measurements for high-speed power supply testing.
- 6314 AChroma
- 62015 L 60 6Chroma
- 61314 AChroma
- 61604Chroma
- 58630ChromaCategoryTest & Probe
- 7940Chroma
Chroma 7940 is a grip ring holder or wafer frame inspection system with dual 25M color CMOS cameras, multiple lighting options, auto focus, auto rotation, and edge detection.
WaferGrip Ring Holder or Wafer frame - 19073 AC DC IR HipotChroma
The Chroma 19073 AC / DC / IR Hipot Tester is a multi-voltage hipot tester.
CategoryTest & Probe - 3110 Tri-TempChromaCategoryTest & Probe
- 58173 FCChroma
- 3110Chroma
The Chroma 3110 is a handler described as a tri-temp unit that includes a chiller.
CategoryTest & Probe - 6312 A DC Electronic Load MainframeChroma
The Chroma 6312 A is a DC electronic load mainframe.
- 3650ChromaCategoryTest & Probe
- 6404 Programmable AC SourceChroma
The Chroma 6404 Programmable AC Source is a dual-output AC source with 115 V input, 90-132/180-250 VAC output range, 47-63 Hz frequency, and 7 A maximum current.
- MP 5806Chroma
The Chroma MP 5806 is an RF Test System described as an 8-port unit.
CategoryTest & Probe - 58173 FC LED Flip ChipChromaCategoryTest & Probe
