Accretech
FP 3000
What it is
How it works
General reference — not yet source-verifiedA prober positions a device wafer or other test piece so electrical contact can be made to selected sites through probe needles or probes.
A prober supports repeatable alignment between the contact system and the device under test so electrical measurements can be taken before wafer singulation or packaging.
Where it fits in the process flow
General reference — not yet source-verifiedA prober sits in the wafer test flow before downstream assembly steps.
A prober is used after device fabrication and before final packaging or other back-end processing.
Applications
General reference — not yet source-verifiedA prober is used for wafer-level electrical test and characterization.
A prober is used in semiconductor production and development settings where individual device sites must be contacted for measurement or verification.
What do the numbers mean?
Power & electrical3
Vacuum & pumping1
Configuration & options6
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Why is probing done at the wafer level?General reference — not yet source-verified
Wafer-level probing helps identify good and bad devices early, supports process monitoring, and reduces unnecessary downstream processing of defective material.
What is the basic operating principle of this machine class?General reference — not yet source-verified
The machine aligns probe contacts to target pads on the wafer, establishes temporary electrical contact, and passes signals to test electronics for measurement and analysis.
Not publicly documented
The following facts about the FP 3000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the FP 3000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the FP 3000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the FP 3000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the FP 3000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the FP 3000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
Last updated Oct 13, 2026.
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