Electroglas

The Electroglas EG 6000 e is a wafer prober used in semiconductor test and probe applications.

The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

The Electroglas EG 4090 u is an automatic wafer prober.

The Electroglas 4090 u Film Frame Prober is a film frame prober manufactured by Electroglas.

The Electroglas EG 2001 / 2001 X is a semiconductor manufacturing equipment item for which no technical specifications are publicly recorded.

The Electroglas EG 2001 CX is a wafer prober.

The Electroglas 4090 u+ is a prober.

The Electroglas 4090 FX Pathfinder is a wafer handler categorized under test and probe equipment.

The Electroglas EG 4090 u DD Interface is a semiconductor equipment model listed in an inventory with the asset number 130637 and the last confirm date of March 24, 2025.

The Electroglas EG 2080 X is a wafer prober for 8-inch wafers.

The Electroglas 6000 is a semiconductor wafer prober in the Test & Probe category.

The Electroglas 4090 is a wafer prober used in semiconductor testing.

The Electroglas EG 4090 u+ is a prober for 8-inch wafers.

The Electroglas EG 2001 is a semiconductor wafer prober in the Test & Probe category.

The Electroglas Horizon 4080 X is a wafer prober. The Electroglas Horizon 4080 X is part of Electroglas's Horizon 4000 Series wafer probers.

General referenceThe Electroglas 4090 is a test and probe system used for electrical evaluation of semiconductor devices and wafers. Machines of this class combine probing hardware with measurement functions to contact selected test points and collect device data.

The Electroglas EG 3001 X is a wafer prober that supports 4-inch and 6-inch wafers.

The Electroglas EG Pathfinder Frame is a wafer prober for semiconductor test and probe applications.

The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.

The Electroglas Horizon 4090 is a wafer prober that supports automatic wafer sizing for 100mm to 200mm wafers and has a system accuracy of ±4μm.

The Electroglas EG 1034 is a wafer prober that handles 6-inch wafers.

General referenceThe Electroglas 4090 F is a test and probe system used for wafer-level electrical contact and measurement before singulation. Machines of this class position a wafer and a probe interface so device pads can be contacted for screening, characterization, and production test.

The Electroglas EG 4090 is an automatic wafer prober designed for high-precision wafer-level electrical testing.

The Electroglas 4060 X is a probe station made by Electroglas.

The Electroglas Precio Octo is a tester.

The Electroglas 4090 Automatic Wafer is an automatic wafer prober for wafer-level electrical testing.

The Electroglas 4090 u Wafer Prober is a semiconductor wafer prober.

The Electroglas 4080 u is a wafer prober used in semiconductor testing.

The Electroglas 2001X is an automatic wafer prober used for semiconductor wafer probing, parametric test, and device characterization.

The Electroglas EG 4085 is an automatic wafer prober designed for 8-inch wafers.

The Electroglas 3001 is a prober with 8-inch wafer sizing and hot/cold chuck options.

Electroglas EG4|200 is a wafer prober for 200mm wafer applications, and the EG4|200e is a related variant described for ultra-low-noise probing.

Electroglas EG5|300 is a wafer prober line that includes the ARGOS and EG5|300e variants.

The Electroglas EG 2001 X is a prober used in semiconductor testing.

The Electroglas EG 4090 X is a prober.

The Electroglas EG 6000 is a wafer prober manufactured by Electroglas.

The Electroglas EG 4060 is a wafer prober categorized as test and probe equipment.

The Electroglas EG 4090 is a PCM tester and wafer prober line associated with 200 mm wafer probing and high-throughput fast probing for small die.

The Electroglas 4090 FX Film Frame is a Test & Probe prober.

Electroglas EG 2001 X Automatic Wafer Prober is an automatic wafer prober with mapping capabilities.

The Electroglas EG 4080 is a prober for semiconductor wafer testing, accepting 8-inch wafers and offering options such as a nickel hot chuck rated to +150°C and an IOSS 120 wafer reader.

The Electroglas 2001 CX is a wafer prober designed for 6-inch wafers.