Electroglas

The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

The Electroglas 2001X is an automatic wafer prober used for semiconductor wafer probing, parametric test, and device characterization.

The Electroglas EG 4090 u is an automatic wafer prober.

General referenceThe Electroglas 4090 is a test and probe system used for electrical evaluation of semiconductor devices and wafers. Machines of this class combine probing hardware with measurement functions to contact selected test points and collect device data.

The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.

Electroglas EG4|200 is a wafer prober for 200mm wafer applications, and the EG4|200e is a related variant described for ultra-low-noise probing.

Electroglas EG5|300 is a wafer prober line that includes the ARGOS and EG5|300e variants.

The Electroglas 4090 u+ is a prober.

General referenceElectroglas EG 4090 u+ is a test and probe system used to electrically characterize semiconductor devices at the wafer level. Machines of this class combine precision wafer positioning with electrical measurement so individual dies or structures can be contacted and evaluated before singulation and later assembly.

The Electroglas 3001 is a prober with 8-inch wafer sizing and hot/cold chuck options.

The Electroglas Precio Octo is a tester.

Electroglas EG 2001 X Automatic Wafer Prober is an automatic wafer prober with mapping capabilities.