Nikon

Plate 01Nikon LV100 Brightfield Darkfield Microscope [BOSTONIND] - 41964
Plate 02Nikon LV100 Microscope [BOSTONIND] - 32452 #2
Plate 03Nikon Eclipse E600 Fluorescence Microscope Pred. to LV100 LV150 - 12084
Plate 04Nikon LV100 Brightfield Darkfield BF DF Motorized Components Microscope 25097
The Nikon LV100 is an optical microscope for inspection and observation of solid samples. Optical inspection microscopes of this class are used to examine surface features, defects, pattern quality, particles, and material structure on prepared specimens. Optical inspection microscopes of this class are commonly used in laboratories and fab support spaces for quick visual review before or after more specialized measurement steps.
Microscopes in this class are used for routine visual review of patterned surfaces, films, grains, inclusions, scratches, residue, cracking, alignment quality, and other observable sample conditions. Polarized configurations are useful for samples whose optical response changes with orientation, such as crystalline, birefringent, or stress-bearing materials.
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The Nikon LV100 is installed in the Soft & Hybrid Materials Facility in Shriram 099.[2]
The following facts about the LV100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the LV100 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the LV100 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the LV100 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the LV100 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the LV100 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 17, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.