Nikon
The Nikon MM40 is an inspection and 2-D metrology microscope. The Nikon MM40 offers measurement XYZ functionality.[1]

Plate 01Nikon MM40 Inv# 63868
Plate 02Nikon MM-40 Measuring Microscope - Teardown
Plate 03[DW]USED Nikon MM-40 MEASURING MICROSCOPE SC-212 DP-202 C-FI115 AC Adapter 取扱説明書付 [ST5370001]
Process applications and technology nodes documented for this tool.
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The following facts about the MM40 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MM40 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the MM40 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MM40 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MM40 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the MM40 are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Aug 13, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD compatible with the KLA AIT-XP.