Nikon
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
In this class of equipment, the microscope is used to examine surface features, pattern fidelity, and defects on opaque specimens. It is a bench-top inspection instrument rather than a process tool, and it supports visual review of prepared samples under different illumination modes.
A metallurgical inspection microscope in this class directs light onto the specimen and collects the return image through an objective and observation head. Different illumination paths and contrast accessories are used to emphasize topography, edges, and low-contrast surface detail on opaque materials such as wafers and chip surfaces.
This type of microscope sits in the inspection and metrology portion of the semiconductor workflow, after a specimen or wafer has been prepared for optical review and before any decision is made about defect disposition or rework. It is used on completed surfaces rather than for front-end patterning or deposition.
Be the first to add cited specifications for this tool.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The following facts about the Optiphot 100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the Optiphot 100 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Optiphot 100 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Optiphot 100 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Optiphot 100 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Optiphot 100 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No research found yet — worked with this tool? Share what you know.
Last updated Jul 30, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD compatible with the KLA AIT-XP.