Olympus
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The Olympus MX 50 is a microscope.[1]
An upright microscope illuminates the sample from above through the objective lens and collects reflected or transmitted light to form an image. The system typically includes a light source, condenser, objective turret, and eyepieces or a camera port.
For semiconductor applications, the microscope may be configured with motorized stage automation, auto-focus, and image analysis software to support repetitive inspection routines.
The microscope serves as a non-destructive inspection tool that can be used at multiple stages of wafer processing, from incoming material verification to final device inspection.
Applications include defect inspection of patterned wafers, critical dimension measurement, overlay registration check, and general surface examination. The microscope can be used with different contrast methods such as brightfield, darkfield, and differential interference contrast.
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The following facts about the MX 50 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the MX 50 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MX 50 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MX 50 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MX 50 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MX 50 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Oct 2, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.