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Olympus

MX51

Metrology & InspectionOlympus MX51 family
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Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Olympus MX51 is a universal reflected-light large stage microscope designed for industrial applications including inspection of electronic devices, molds, wafers, metal and plastic parts. The Olympus MX51 supports brightfield, darkfield, differential interference contrast (DIC), simplified polarized light, and infrared observation modes. The Olympus MX51 accepts wafer sizes up to 150 mm (6 inches) via optional motorized stages and wafer chucks.[1][2]

Olympus logo
Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

What it is

The Olympus MX51 is a universal reflected-light large stage microscope intended for industrial applications such as inspection of electronic devices, molds, wafers, metal, and plastic parts. The Olympus MX51 features a trinocular viewing head with super widefield 10x eyepieces that provide a 26.5 mm field of view. The Olympus MX51 is equipped with a 5-position brightfield/darkfield nosepiece. The Olympus MX51 uses the proprietary Frontal Control operational system and UIS2 optics. The Olympus MX51 is compact, simple to operate, and has a flexible modular design.[4][1]

How it works

The Olympus MX51 incorporates a Frontal Control operational system that places all controls within easy reach of the operator. The Olympus MX51 uses a reflected light illuminator with a halogen lamp housed in a 100 W lamphouse. The Olympus MX51 has a 5-position nosepiece for objectives. The Olympus MX51 allows adjustment of illumination brightness and control of the field iris diaphragm and aperture iris diaphragm. The Olympus MX51 stage is moved using coaxial coarse and fine adjustment knobs, with a tension adjustment for the coarse knob. The Olympus MX51 supports multiple observation methods including brightfield, darkfield, differential interference contrast, simplified polarized light, and infrared light observation.[1][2]

Where it fits in the process flow

The Olympus MX51 is designed for semiconductor analysis. The Olympus MX51 can be fitted with stages and sample holders that accommodate wafers up to 6 inches in diameter. The Olympus MX51 is used for inspection of wafers and other flat components in a cleanroom or industrial setting.[5]

What do the numbers mean?

Power & electrical1

Wafer size capability
Up to 6 inch (150 mm) with optional wafer chucks (HWC15S for 4" & 6", HWC15V for 150 mm)[5]
Accurate?

Optics & imaging3

Optical system
UIS2 (UIS) universal infinity system[2]
Accurate?
Reflected light illuminator
Brightfield/Darkfield illuminator with 100W halogen lamphouse (U-LH100L-3)[4]
Accurate?
Objectives (standard set)
MPlanFL N BD 5x, LMPlanFL N BD 10x, 20x, 50x[4]
Accurate?

Dimensions & facilities1

Microscope frame weight
About 11 kg (24.3 lbs); total system weight about 26 kg (57.3 lbs)[2]
Accurate?

Configuration & options9

Type
Fluorescence Microscope[3]
Accurate?
Viewing head
Trinocular erect image head (U-ETR-4)[4]
Accurate?
Eyepieces
10x/26.5 mm super widefield[4]
Accurate?
Nosepiece
5-position brightfield/darkfield nosepiece (U-D6BDRE)[4]
Accurate?
Stage (manual)
MX-SIC6R2 6x6-inch stage or U-SIC4R2/SIC4L2 4x4-inch stage[2]
Accurate?
Motorized XY stage
ProScan H105/2OL series with 154x154 mm travel, encoded or non-encoded options[5]
Accurate?
Halogen lamp life
2000 hours for long-life type 6V30WHAL-L[2]
Accurate?
Autofocus (optional)
PF850 standalone hardware autofocus[5]
Accurate?
Standards compliance
CE, FCC Part 15 Class A, SEMI S2-0703, SEMI S8-1103[2]
Accurate?
Interested in this tool?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Wafer size capabilityUp to 6 inch (150 mm) with optional wafer chucks (HWC15S for 4" & 6", HWC15V for 150 mm)[5]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Frequently asked questions

What is the maximum wafer size that the Olympus MX51 can handle?

The Olympus MX51 can accommodate wafers up to 6 inches in diameter when fitted with appropriate stages and sample holders.[5]

What observation modes are available on the Olympus MX51?

The Olympus MX51 supports reflected light brightfield and darkfield observation, as well as differential interference contrast, simplified polarized light, and infrared light observation.[2]

What is the field number of the eyepieces on the Olympus MX51?

The Olympus MX51 is equipped with super widefield 10x eyepieces that provide a 26.5 mm field of view.[4]

What type of illumination does the Olympus MX51 use?

The Olympus MX51 uses a reflected light illuminator with a halogen 100 W lamphouse.[4]

Not publicly documented

The following facts about the MX51 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MX51 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the MX51 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the MX51 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the MX51 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the MX51 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (7)Every fact above is drawn from these public sources
  1. [1]Olympus MX51 Microscope | Microscope Service and Salesmicroscopy.uk.commicroscopy.uk.com
  2. [2]metallurgicalmicroscopes.commetallurgicalmicroscopes.commetallurgicalmicroscopes.com
  3. [3]wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
  4. [4]microscopecentral.commicroscopecentral.commicroscopecentral.com
  5. [5]prior.comprior.comprior.com
  6. [6]Tool List - UCSB Nanofab Wikiwiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
  7. [7]Tool List - UCSB Nanofab Wikiwiki.nanofab.ucsb.eduwiki.nanofab.ucsb.edu
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Last updated Aug 13, 2026.

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