Olympus
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Olympus MX51 is a universal reflected-light large stage microscope designed for industrial applications including inspection of electronic devices, molds, wafers, metal and plastic parts. The Olympus MX51 supports brightfield, darkfield, differential interference contrast (DIC), simplified polarized light, and infrared observation modes. The Olympus MX51 accepts wafer sizes up to 150 mm (6 inches) via optional motorized stages and wafer chucks.[1][2]
The Olympus MX51 is a universal reflected-light large stage microscope intended for industrial applications such as inspection of electronic devices, molds, wafers, metal, and plastic parts. The Olympus MX51 features a trinocular viewing head with super widefield 10x eyepieces that provide a 26.5 mm field of view. The Olympus MX51 is equipped with a 5-position brightfield/darkfield nosepiece. The Olympus MX51 uses the proprietary Frontal Control operational system and UIS2 optics. The Olympus MX51 is compact, simple to operate, and has a flexible modular design.[4][1]
The Olympus MX51 incorporates a Frontal Control operational system that places all controls within easy reach of the operator. The Olympus MX51 uses a reflected light illuminator with a halogen lamp housed in a 100 W lamphouse. The Olympus MX51 has a 5-position nosepiece for objectives. The Olympus MX51 allows adjustment of illumination brightness and control of the field iris diaphragm and aperture iris diaphragm. The Olympus MX51 stage is moved using coaxial coarse and fine adjustment knobs, with a tension adjustment for the coarse knob. The Olympus MX51 supports multiple observation methods including brightfield, darkfield, differential interference contrast, simplified polarized light, and infrared light observation.[1][2]
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The Olympus MX51 can accommodate wafers up to 6 inches in diameter when fitted with appropriate stages and sample holders.[5]
The Olympus MX51 supports reflected light brightfield and darkfield observation, as well as differential interference contrast, simplified polarized light, and infrared light observation.[2]
The Olympus MX51 is equipped with super widefield 10x eyepieces that provide a 26.5 mm field of view.[4]
The Olympus MX51 uses a reflected light illuminator with a halogen 100 W lamphouse.[4]
The following facts about the MX51 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MX51 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MX51 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MX51 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MX51 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MX51 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Aug 13, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD compatible with the KLA AIT-XP.