Waferpedia

Rudolph

3Di

3Di — web.archive.org
Fig. 013Diweb.archive.org[1]

What is it?

The Rudolph 3Di System is specifically designed for bumped device manufacturers and is described as a complete high-throughput, high-accuracy system for 100% bump and wafer inspection. It uses a patent-pending RCS sensor for 3D inspection and metrology and is stated to support all bump processes and materials, under bump metalization, pre- and post-reflow, and other wafer-level packaging inspection applications.

What can it run?

Process applications and technology nodes documented for this tool.

  • Bumped device manufacturing
  • 3D bump inspection and metrology
  • 2D bump inspection and metrology
  • Under bump metalization (UBM)
  • Pre- and post-reflow inspection
  • Wafer level packaging inspection
  • Redistribution lines inspection
  • Thick films inspection
  • Vias inspection
  • Intermediate interconnects inspection

What do the numbers mean?

Wafer handling3

Inspection capabilities
Complete high-throughput, high-accuracy, 100% bump and wafer inspection in one system[1]
Accurate?
Application flexibility
All bump processes and materials; under bump metalization (UBM); pre- and post-reflow; other wafer level packaging inspection including redistribution lines, thick films, vias, and intermediate interconnects[1]
Accurate?
Wafer handling
Whole wafers 75 mm-300 mm; sawn wafers up to 300 mm on film frames[1]
Accurate?

Configuration & options2

3D sensor
Revolutionary RCS sensor for 3D inspection and metrology[1]
Accurate?
2D inspection
Industry leading 2D inspection and metrology[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the 3Di are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 3Di are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 3Di are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 3Di are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 3Di are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 3Di is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.orgweb.archive.org
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Last updated Jul 29, 2026.

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