Teradyne
ETS 88
The Teradyne ETS 88 is a precision power and analog test system for production board test. The ETS 88 configuration includes eight DPS 16 modules, seven SPU 100 modules, fifteen APU 12 modules, four QTMU modules, and one CBIT board.[1]
Plate 01ADC Test using ETS-88
FAHMI ARIF MUHAMADWatch on YouTube
What it is
General reference — not yet source-verifiedA semiconductor test system applies electrical stimuli to a device under test and measures the device response against programmed limits. A test system of this class is used to verify electrical behavior, screen for defects, and sort parts by pass or fail criteria. A test system of this class commonly interfaces with a handler or a probed contact arrangement so that devices can be contacted repeatably during production testing.
How it works
General reference — not yet source-verifiedA semiconductor tester of this class drives signals and power into the device under test through a contact interface and measures resulting voltages, currents, timing relationships, and logic states. A semiconductor tester of this class combines stimulus resources, measurement resources, timing control, and test software so that a programmed sequence can exercise device functions and evaluate the returned results. A semiconductor tester of this class commonly uses interchangeable instruments and interface hardware to match the electrical requirements of different products.
Where it fits in the process flow
General reference — not yet source-verifiedAn electrical test system of this class sits after wafer fabrication and packaging steps, at points where devices or assemblies are ready for electrical verification. An electrical test system of this class is used in production flows that need outgoing quality screening, characterization, or functional confirmation before subsequent assembly stages or shipment to the next manufacturing operation. When used with probing, an electrical test system of this class can support device contact before singulation or package completion. When used with handling equipment, an electrical test system of this class can support packaged-device test in automated production flow.
Applications
General reference — not yet source-verifiedA test system of this class is used for electrical verification of semiconductor devices and other electronic units that must be contacted and measured under controlled conditions. A test system of this class can be applied to functional checks, parametric measurements, continuity verification, isolation checks, and stress-related electrical evaluations, depending on the installed instrumentation and test program. A test system of this class is also used where production operations need repeatable pass or fail decisions based on measured electrical behavior.
What do the numbers mean?
Control & software3
- PC[3]
Configuration & options31
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What types of devices can be tested with this class of machine?General reference — not yet source-verified
Machines of this class are designed to test a broad variety of semiconductor devices, including digital, analog, mixed-signal, and power management ICs. The specific device types depend on the instrument configuration and the test head used.
How does the test system interface with a wafer prober?General reference — not yet source-verified
The test system connects to a wafer prober through a mechanical interface that aligns the probe card with the wafer. The test head provides electrical connections for all probes, and the prober steps the wafer under computer control while the tester applies signals and collects measurements from each die site.
What test capabilities does this class of equipment typically support?General reference — not yet source-verified
Typical capabilities include DC parametric measurement (voltage, current, resistance), functional logic testing, frequency and timing measurement, analog waveform generation and capture, and built-in self-test (BIST) support. Many systems also offer parallel test to increase throughput.
How is the test program developed for such a system?General reference — not yet source-verified
Test programs are created using the system's proprietary software environment, often with a graphical user interface for pattern generation, test flow definition, and limit setting. The program is compiled and loaded onto the tester, then debugged using simulation and dry-run modes before production use.
What are common maintenance considerations for this class of machine?General reference — not yet source-verified
Regular maintenance includes calibration of power supplies and measurement instruments, cleaning of probe card or socket interfaces, and periodic software updates. Downtime is minimized through preventive maintenance schedules and use of spare parts such as Pogo pins, cables, and cooling fans.
Not publicly documented
The following facts about the ETS 88 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ETS 88 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ETS 88 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ETS 88 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ETS 88 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the ETS 88 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]web.archive.org — teradyne.com (May 5, 2026)web.archive.org
- [2]Inventory photo
- [3]inventory listing
- [4]inventory listing
- [5]patents.google.compatents.google.com
- [6]patents.google.compatents.google.com
Last updated Oct 16, 2026.
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