Advantest
V 93000
Plate 01Celebrating 25 Years of Innovation: The V93000 Anniversary Special
AdvantestWatch on YouTubePlate 02Advantest V93000 Wave Scale RF
AdvantestWatch on YouTubePlate 03V93000 EXA Scale
Advantest GroupWatch on YouTubePlate 04Advantest V93000 Wave Scale Benefits
AdvantestWatch on YouTubePlate 05Verigy V93000 Launch Video: The Best Got Better
Tam CommunicationsWatch on YouTubePlate 06TechTuesday: Advantest's V93000 Wave Scale RF
AdvantestWatch on YouTube
What is it?
Applications
What do the numbers mean?
Power & electrical4
Configuration & options13
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne J 750— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne ETS 364— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne Ultra Flex SC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne iFlex— Same function class: Test & Probe, UnknownCompare in depthsource[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What type of equipment is the Advantest V 93000 used as?
It is used as semiconductor automatic test equipment for chip mass production testing.[8]
Not publicly documented
The following facts about the V 93000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the V 93000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the V 93000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the V 93000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the V 93000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the V 93000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (10)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]inventory listing
- [6]Equipment inventory listing
- [7]Equipment inventory listing
- [8]CN121031530B - 93K batch conversion standard TESTSUITE name method - Google Patents — patents.google.compatents.google.com
- [9]Equipment inventory listing
- [10]Products - ADVANTEST CORPORATION — advantest.co.jp (Jul 2, 2013)web.archive.org
Last updated Jul 29, 2026.
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General referenceTeradyne ETS 364 is a test and probe system used to electrically evaluate semiconductor devices. Machines of this class combine probe contact, signal handling, and automated test control for device characterization and screening.
General referenceTeradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
