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93000 Smart Scale
What it is
How it works
General reference — not yet source-verifiedA semiconductor tester applies controlled electrical signals to a device under test, measures the response, and compares the results with expected behavior to sort parts and verify function. Systems of this class use modular test electronics, probe or contact hardware, and control software to route signals, supply power, and capture measurements.
Where it fits in the process flow
General reference — not yet source-verifiedThis kind of equipment sits in semiconductor electrical test, where wafers or packaged devices are exercised before final acceptance. It is used after front-end fabrication steps and before parts move onward to downstream sorting, assembly, or final test workflows.
The probe-and-test role links wafer-level contact with device verification, so the system belongs near the handoff between probe operations and later package-level evaluation when used in a test floor sequence.
Applications
What do the numbers mean?
Configuration & options32
- Workstation: Z4G4 - Thermal Head: CTH - Total Cards: 14 - PS1600B: 6 - PS9G: 3[15]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne iFlex— Same function class: Test & Probe, UnknownCompare in depthsource[16]
- Teradyne Nextest Magnum I PV— Same function class: Test & Probe, UnknownCompare in depthsource[17]
- Teradyne MicroFlex— Same function class: Test & Probe, UnknownCompare in depthsource[18]
- Teradyne J 750 S— Same function class: Test & Probe, UnknownCompare in depthsource[19]
- Teradyne J 750 EX— Same function class: Test & Probe, UnknownCompare in depthsource[20]
- LTX-Credence TMT ASL 1000 165— Same function class: Test & Probe, UnknownCompare in depthsource[21]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What is a test and probe system used for?General reference — not yet source-verified
It is used to make temporary electrical contact with semiconductor devices so their behavior can be measured and classified before later processing or assembly.
What does this class of equipment measure?General reference — not yet source-verified
It measures electrical responses such as device functionality, parametric behavior, and pass or fail results against test criteria.
Where does a probe-based tester fit in manufacturing?General reference — not yet source-verified
It is used early enough in the flow that devices can still be contacted directly, usually before packaging or final integration.
Why is probe contact important in this equipment class?General reference — not yet source-verified
Probe contact provides the temporary electrical path needed to apply test signals and read device responses without permanently attaching leads.
What kinds of tasks are common for this equipment class?General reference — not yet source-verified
Common tasks include screening devices, sorting good and bad parts, and collecting electrical data for process control and characterization.
Not publicly documented
The following facts about the 93000 Smart Scale are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 Smart Scale are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 93000 Smart Scale are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 93000 Smart Scale are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 Smart Scale are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 Smart Scale is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (21)Every fact above is drawn from these public sources
- [1]Inventory photo
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- [16]Equipment inventory listing
- [17]Equipment inventory listing
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- [20]Equipment inventory listing
- [21]Equipment inventory listing
Last updated Jul 30, 2026.
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General referenceTeradyne J 750 EX is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates devices and identifies dies or parts that meet specification.
General referenceTeradyne J 750 S is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates integrated circuits while they are still on wafer or in related test handling workflows.
General referenceTeradyne MicroFlex is a test and probe system used for electrical examination of semiconductor devices and wafers. It belongs to the class of equipment that makes controlled contact with device pads or probe sites so signals and measurements can be applied and read back.
