Teradyne
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Teradyne / Nextest Magnum II EV 128 is a tester. The tester is from OEM Teradyne / Nextest.[1]
The Teradyne Nextest Magnum II EV 128 is a semiconductor test system designed for testing integrated circuits.[1]
The system applies electrical test patterns to each device being tested and measures the resulting responses to determine functionality and perfoamance.
The tester is placed either at wafer probe or final package test in the semiconductor manufacturing flow.
The system is used for testing digital integrated circuits such as microcontrollers, ASICs, and logic devices.
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The following facts about the Nextest Magnum II EV 128 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nextest Magnum II EV 128 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Nextest Magnum II EV 128 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Nextest Magnum II EV 128 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Nextest Magnum II EV 128 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Nextest Magnum II EV 128 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 1, 2026.
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